Company Filing History:

14 out of 2,467

Nec Electronics Corporation

Years Active: 1991-2012

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22 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8089817 - Precise tRCD measurement in a semiconductor memory device (2012-01-03),

2. 7978543 - Semiconductor device testable on quality of multiple memory cells in parallel and testing method of the same (2011-07-12),

3. 7746711 - Semiconductor device and semiconductor chips outputting a data strobe signal (2010-06-29),

4. 7193917 - Semiconductor storage device, test method therefor, and test circuit therefor (2007-03-20),

5. 7145830 - Semiconductor memory device (2006-12-05),

6. 7089351 - Semiconductor memory device for preventing a late write from disturbing a refresh operation (2006-08-08),

7. 7054224 - Non-synchronous semiconductor memory device having page mode read/write (2006-05-30),

8. 7035154 - Semiconductor memory device and its test method as well as test circuit (2006-04-25),

9. 7006401 - Semiconductor storage device and refresh control method thereof (2006-02-28),

10. 6947345 - Semiconductor memory device (2005-09-20),

11. 6944081 - Semiconductor storage and its refreshing method (2005-09-13),

12. 6928020 - Semiconductor memory device (2005-08-09),

13. 6922371 - Semiconductor storage device (2005-07-26),

14. 6876592 - Semiconductor memory device (2005-04-05),

15. 6834020 - Semiconductor storage device (2004-12-21),

Title: Hideo Inaba: A Pioneer in Semiconductor Innovations

Introduction

Hideo Inaba, based in Kanagawa, Japan, is a distinguished inventor with an impressive portfolio of 22 patents. His innovative contributions in the field of semiconductor technology have paved the way for advancements in memory devices, enhancing their performance and reliability.

Latest Patents

Inaba's recent patents showcase his expertise in semiconductor memory devices. One notable patent titled "Precise tRCD measurement in a semiconductor memory device" details a method for capturing row and column address signals during both normal and test operation modes. This innovation allows for precise measurement of the time period from the input of read/write commands to the activation of corresponding row and column addresses, enhancing the efficiency of memory devices.

Another significant patent is "Semiconductor device testable on quality of multiple memory cells in parallel and testing method of the same." This invention describes a semiconductor device that includes input/output terminals and a by-path route that changes states between normal and test modes. The ability to test multiple memory cells in parallel significantly improves quality assessment processes within semiconductor technology.

Career Highlights

Hideo Inaba has had a remarkable career, having worked with prominent companies such as NEC Electronics Corporation and NEC Corporation. His tenure at these organizations allowed him to collaborate with like-minded professionals and contribute to cutting-edge semiconductor solutions.

Collaborations

Throughout his career, Inaba has worked alongside notable colleagues, including Atsushi Nakagawa and Satoshi Yamamoto. These collaborations have fostered a rich exchange of ideas, driving innovation in the field of semiconductor technology.

Conclusion

Hideo Inaba's contributions to semiconductor innovation through his 22 patents reflect his dedication to advancing technology. His groundbreaking work on memory devices not only showcases his exceptional inventiveness but also significantly impacts the electronics industry, setting new standards for performance and testing methodologies.

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