Tokyo, Japan

Hajime Kawano

This inventor holds 76 USPTO granted patents and 13 published patent applications, primarily in Charged Particle Beam Technology (CPC class H01J). Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Hitachi Medical Corporation. Active years: 1997-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hajime Kawano. Retrieved from https://idiyas.com/inventor/hajime-kawano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 76 

% Patents Active = 89.5

Average Co-Inventor Count = 4.3

ph-index = 9

Forward Citations = 269(Granted Patents)

Forward Citations (Not Self Cited) = 246(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Abiko, JP (1997)
  • Hitachinaka, JP (2002 - 2019)
  • Tokyo, JP (1999 - 2024)

Company Filing History:


Years Active: 1997-2026

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Areas of Expertise:
Charged Particle Beam
Electron Gun
Scanning Electron Microscope
Radiation Detector
Thermoelectric Field Emission
Cross-Sectional Shape Estimation
High Voltage Power Supply
Measurement Device
Inspection Method
Beam Blanking
Noise Source Determination
76 patents (USPTO):Explore Patents

Title: Unveiling the Innovations of Hajime Kawano

Introduction

Hajime Kawano, a prominent inventor based in Tokyo, Japan, has significantly contributed to the world of charged particle beam technology with an impressive portfolio of 71 patents. His inventive spirit and dedication to technological advancements have placed him at the forefront of innovation in his field.

Latest Patents

Among his latest groundbreaking inventions, Kawano has developed two notable patents related to charged particle beam devices. The first patent focuses on a charged particle beam device that effectively reduces positional shifts between secondary beams generated in a beam separator. This invention incorporates a charged particle beam source that irradiates a sample with multiple primary beams, along with a series of detectors that detect the secondary beams emitted from the sample. A crucial component of this device is a deflector placed between the beam separator and the detector to correct any positional shifts, thus optimizing the accuracy and efficiency of the beam device.

In addition, his second patent outlines another variation of a charged particle beam device that utilizes a control system to measure and correct the intensity distribution of signal charged particle beams detected by various detector units. The control system generates precise images based on this corrected intensity distribution, enhancing the functionality and effectiveness of charged particle beam applications.

Career Highlights

Kawano's professional journey includes significant tenure at leading companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His roles at these esteemed organizations have allowed him to refine his expertise in the field and innovate solutions that push the boundaries of existing technologies.

Collaborations

Throughout his career, Hajime Kawano has collaborated with talented individuals like Hiroyuki Takahashi and Wen Zheng Li. These collaborations have fostered an environment of shared knowledge and creativity, ultimately leading to more advanced inventions in charged particle beam technology.

Conclusion

Hajime Kawano stands as a beacon of innovation in the realm of charged particle beam technologies. His prolific contributions and collaborations illustrate his commitment to advancing the field, ensuring his legacy as a pioneering inventor in Tokyo and beyond. With his impressive patent portfolio, Kawano not only influences his immediate environment but also shapes the future of technological advancements worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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