The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Dec. 11, 2023
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kaoru Sakai, Tokyo, JP;

Mayuka Osaki, Tokyo, JP;

Hajime Kawano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/22 (2006.01); G06T 5/70 (2024.01); G06T 5/94 (2024.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01); G06V 10/22 (2022.01); G06V 10/74 (2022.01); H01J 37/244 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/222 (2013.01); G06T 5/70 (2024.01); G06T 5/94 (2024.01); G06T 7/001 (2013.01); G06T 7/70 (2017.01); G06V 10/22 (2022.01); G06V 10/74 (2022.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30148 (2013.01); H01J 2237/2448 (2013.01);
Abstract

A processor system capable of communicating with the multi-charged particle beam device includes reducing an influence of first crosstalk caused by a first detector detecting secondary electrons from a second scanning region by recognizing a first ghost caused by the first crosstalk from a first image using the first image. The processor system modifies a first occurrence region of the first ghost, or outputs a defect candidate position as a defect position when the detected defect candidate position is outside the first occurrence region.


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