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For the Inventor, By the Inventor

Nirasaki, Japan

Eiichi Shinohara

This inventor holds 10 USPTO granted patents and 5 EPO patents. Top assignees: Tokyo Electron Limited, Tokyo Electron Limi Ted. Active years: 2010-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiichi Shinohara. Retrieved from https://idiyas.com/inventor/eiichi-shinohara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10

% Patents Active = 80.0

 

Average Co-Inventor Count = 2.8

ph-index = 2

Forward Citations = 568(Granted Patents)


Location History:

  • Nirasaki, JP (2010 - 2017)
  • Yamanashi, JP (2016 - 2017)

Company Filing History:

goldMedal9 out of 10,883 
 
Tokyo Electron Limited
 patents
silverMedal1 out of 103 
 
Tokyo Electron Limi Ted
 patents

Years Active: 2010-2017

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10 patents (USPTO):Explore Patents
1. 9759762 - Probe device (2017-09-12),
2. 9658285 - Probe apparatus (2017-05-23),
3. 9638719 - Probe device having cleaning mechanism for cleaning connection conductor (2017-05-02),
4. 9562942 - Probe apparatus (2017-02-07),
5. 9347970 - Probe apparatus (2016-05-24),
6. 9322844 - Probe card for power device (2016-04-26),
7. 9261553 - Probe apparatus (2016-02-16),
8. 8085052 - Charge eliminating apparatus and method, and program storage medium for removing static electricity from a target object such as a wafer (2011-12-27),
9. 7859279 - Charge eliminating apparatus and method, and program storage medium (2010-12-28),
10. D609652 - Wafer attracting plate (2010-02-09),

Title: Eiichi Shinohara: Innovator in Semiconductor Technology

Introduction

Eiichi Shinohara is a prominent inventor based in Nirasaki, Japan, known for his significant contributions to semiconductor technology. With a total of 10 patents to his name, Shinohara has developed innovative devices that enhance the efficiency and effectiveness of semiconductor testing.

Latest Patents

Shinohara's latest patents include a probe device and a probe apparatus. The probe device features an electrode plate positioned above a mounting table for semiconductor wafers, which is electrically connected to a tester. It includes a contact probe that has a uniquely designed contact portion to ensure reliable electrical connections. The probe apparatus, on the other hand, consists of a movable mounting table that holds a test object with multiple power devices. This apparatus is equipped with a measuring unit that assesses the electrical characteristics of the power devices by establishing electrical contact through probes.

Career Highlights

Throughout his career, Eiichi Shinohara has worked with notable companies, including Tokyo Electron Limited. His work has significantly impacted the field of semiconductor testing, leading to advancements that benefit various industries reliant on semiconductor technology.

Collaborations

Shinohara has collaborated with esteemed colleagues such as Munetoshi Nagasaka and Ken Taoka, contributing to the development of innovative solutions in semiconductor technology.

Conclusion

Eiichi Shinohara's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor testing and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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