The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Jul. 30, 2012
Applicants:

Eiichi Shinohara, Nirasaki, JP;

Ikuo Ogasawara, Nirasaki, JP;

Ken Taoka, Nirasaki, JP;

Inventors:

Eiichi Shinohara, Nirasaki, JP;

Ikuo Ogasawara, Nirasaki, JP;

Ken Taoka, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 1/06711 (2013.01); G01R 31/2601 (2013.01); G01R 1/06777 (2013.01); G01R 31/263 (2013.01); G01R 31/2608 (2013.01); G01R 31/2621 (2013.01); G01R 31/2632 (2013.01);
Abstract

A probe cardincludes a first probeconfigured to come into electric contact with an emitter electrode of a power device D; a block-shaped first connecting terminalto which the first probeis connected; a second probeconfigured to come into electric contact with a gate electrode of the power device D; a block-shaped second connecting terminalto which the second probeis connected; a contact plateconfigured to come into electric contact with a collector electrode of the power device D; and a block-shaped third connecting terminalfixed to the contact plate. Further, the first connecting terminal, the second connecting terminaland the third connecting terminalelectrically come into direct contact with corresponding connection terminals of a tester, respectively.


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