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Years Active: 2010-2017
Title: The Innovations of Christophe Fouquet
Introduction
Christophe Fouquet is a notable inventor based in Sunnyvale, CA. He has made significant contributions to the field of semiconductor technology, particularly in the detection of design and process defects on wafers. With a total of 4 patents to his name, his work has had a considerable impact on the industry.
Latest Patents
Fouquet's latest patents include a system and method for detecting design and process defects on a wafer using process monitoring features. This innovative system is designed to identify defects at specific locations on a wafer by utilizing images acquired through an electron beam review subsystem. The system compares these images to stored designs in a database to detect discrepancies. Additionally, he has developed methods for classifying defects observed by imaging tools through automatic comparisons with design information, enhancing the accuracy of defect classification.
Career Highlights
Throughout his career, Christophe Fouquet has worked with prominent companies in the semiconductor industry, including KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to refine his expertise in defect detection and process monitoring.
Collaborations
Fouquet has collaborated with several professionals in his field, including Gordon Abbott and Zain Saidin. These collaborations have contributed to the advancement of technologies related to wafer inspection and defect analysis.
Conclusion
Christophe Fouquet's innovative work in the semiconductor industry has led to significant advancements in defect detection and classification. His contributions continue to influence the field and improve the quality of semiconductor manufacturing.