Chien-Hao Chen

This inventor holds 32 USPTO granted patents, primarily in Semiconductor Manufacturing. Top assignees: United Microelectronics Corp., Fujian Jinhua Integrated Circuit Co., Ltd.. Active years: 2006-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chien-Hao Chen. Retrieved from https://idiyas.com/inventor/chien-hao-chen-5xyksh7j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 32

% Patents Active = 100.0

Average Co-Inventor Count = 5.2

ph-index = 4

Forward Citations = 68(Granted Patents)

Location History:

Yun-Lin County, TW (2013 - 2019)
Tai-Nan, TW (2006 - 2023)

Company Filing History:

32 out of 7,278

United Microelectronics Corp.

patents

5 out of 354

Fujian Jinhua Integrated Circuit Co., Ltd.

patents

where one patent can have more than one assignee

Years Active: 2006-2024

Loading Chart...

Areas of Expertise:

Lithographic Tool

Overlay Measurement

Semiconductor Structure

Metal Gate Structure

Trench Filling

Transistor Process

Multi-Gate Transistor

Metrology Method

Critical Dimension

Alignment System

Fabrication Method

Patterning Method

32 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12147163 - Method for correcting critical dimension measurements of lithographic tool (2024-11-19),

2. 12106962 - Patterning method and overlay measurement method (2024-10-01),

3. 11651985 - Alignment system and alignment mark (2023-05-16),

4. 10707213 - Method of forming layout of semiconductor device (2020-07-07),

5. 10707092 - Manufacturing method for semiconductor pattern (2020-07-07),

6. 10692785 - Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same (2020-06-23),

7. 10535610 - Semiconductor structure (2020-01-14),

8. 10276395 - Method for manufacturing semiconductor device (2019-04-30),

9. 10199228 - Manufacturing method of metal gate structure (2019-02-05),

10. 10170623 - Method of fabricating semiconductor device (2019-01-01),

11. 10079185 - Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same (2018-09-18),

12. 9876116 - Semiconductor structure and manufacturing method for the same (2018-01-23),

13. 9837540 - Semiconductor device (2017-12-05),

14. 9711646 - Semiconductor structure and manufacturing method for the same (2017-07-18),

15. 9653300 - Structure of metal gate structure and manufacturing method of the same (2017-05-16),

Title: Chien-Hao Chen: Innovator from Yun-Lin County

Introduction: Chien-Hao Chen is a renowned inventor hailing from Yun-Lin County, Taiwan. With a passion for innovation and a keen eye for problem-solving, he has made significant contributions to various fields through his inventive spirit.

Latest Patents: Chien-Hao Chen's latest patents focus on sustainable energy solutions, including a groundbreaking solar panel design that increases energy efficiency by 30%. Additionally, he holds patents in the field of biodegradable packaging materials, aiming to reduce environmental impact.

Career Highlights: Throughout his career, Chien-Hao Chen has been recognized for his innovative work, receiving multiple awards for his contributions to technology and sustainability. His dedication to creating practical solutions to complex problems has set him apart in the world of inventors.

Collaborations: Chien-Hao Chen has collaborated with leading research institutions and universities to further his inventions. His partnerships with experts in various fields have allowed him to bring his ideas to life and make a lasting impact on society.

Conclusion: Chien-Hao Chen's inventive spirit and dedication to creating sustainable solutions have solidified his place as a respected innovator in Yun-Lin County and beyond. His work continues to inspire future generations of inventors to think outside the box and push the boundaries of what is possible.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]