For the Inventor, By the Inventor

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Concord, CA, United States of America

Xradia, Inc.

Calculating rank

USPTO Granted Patents = 38

% Expired Patents = 13.2

Forward Citations = 1,830

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26 inventors (with patents filed for the assignee):

Wenbing Yun (35 out of 94 patents)

Yuxin Wang (24 out of 24 patents)

Michael Feser (9 out of 17 patents)

4. Frederick William Duewer (8 out of 8 patents)

5. David D Scott (6 out of 65 patents)

6. Alan Francis Lyon (5 out of 20 patents)

7. Andrei V Tkachuk (5 out of 5 patents)

8. David R Trapp (5 out of 5 patents)

9. Kenneth W Nill (4 out of 8 patents)

10. Ying Xu (3 out of 3 patents)

11. Srivatsan Seshadri (2 out of 16 patents)

12. Peiping Zhu (2 out of 3 patents)

13. Ziyu Wu (2 out of 5 patents)

14. Qingxi Yuan (2 out of 2 patents)

15. Wanxia Huang (2 out of 2 patents)

Core Competencies:

X-Ray Lens

Tomographic Projection

X-Ray Microscopy

Fluorescence Microscope

High Resolution Imaging

Phase Contrast

Integrated Circuits

Metrology System

Laminography

Synchrotron Source

Optical System

Detector System

38 patents: Sort by Forward Citations

1. 8526575 - Compound X-ray lens having multiple aligned zone plates (2013-09-03),

2. 8353628 - Method and system for tomographic projection correction (2013-01-15),

3. 8267388 - Alignment assembly (2012-09-18),

4. 8139846 - Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy (2012-03-20),

5. 8068579 - Process for examining mineral samples with X-ray microscope and projection systems (2011-11-29),

6. 7974379 - Metrology and registration system and method for laminography and tomography (2011-07-05),

7. 7920676 - CD-GISAXS system and method (2011-04-05),

8. 7864426 - High aspect-ratio X-ray diffractive structure stabilization methods and systems (2011-01-04),

9. 7813475 - X-ray microscope with switchable x-ray source (2010-10-12),

10. 7800072 - Low pass X-ray scintillator system (2010-09-21),

11. 7796725 - Mechanism for switching sources in x-ray microscope (2010-09-14),

12. 7787588 - System and method for quantitative reconstruction of Zernike phase-contrast images (2010-08-31),

13. 7561662 - X-ray micro-tomography system optimized for high resolution, throughput, image quality (2009-07-14),

14. 7535193 - Five axis compensated rotating stage (2009-05-19),

15. 7499521 - System and method for fuel cell material x-ray analysis (2009-03-03),

Company Overview

Xradia, Inc. is a technology company based in Concord, California, specializing in advanced imaging solutions. The organization focuses on developing innovative X-ray imaging systems that enhance the capabilities of various research and industrial applications. Their technology is utilized in fields such as materials science, life sciences, and semiconductor manufacturing, providing high-resolution imaging that aids in the analysis and understanding of complex structures. Xradia's commitment to research and development positions it as a leader in the imaging technology sector.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

38 Patents

#6 in Concord, CA

#2,133 in California

#9,035 in US

#17,870 in the World

Concord, CA, United States of America

Xradia, Inc.

Forward Citations = 1,830

26 inventors:

Wenbing Yun (35 out of 94 patents)

Yuxin Wang (24 out of 24 patents)

Michael Feser (9 out of 17 patents)

4. Frederick William Duewer (8 out of 8 patents)

5. David D Scott (6 out of 65 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Xradia, Inc.. Retrieved from https://idiyas.com/company/xradia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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