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Concord, CA, United States of America

Xradia, Inc.

USPTO Granted Patents = 38

% Expired Patents = 13.2

Forward Citations = 1,804

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26 inventors (with patents filed for the assignee):

Wenbing Yun (35 out of 93 patents)

Yuxin Wang (24 out of 24 patents)

Michael Feser (9 out of 17 patents)

4. Frederick William Duewer (8 out of 8 patents)

5. David D Scott (6 out of 63 patents)

6. Alan Francis Lyon (5 out of 20 patents)

7. Andrei V Tkachuk (5 out of 5 patents)

8. David R Trapp (5 out of 5 patents)

9. Kenneth W Nill (4 out of 8 patents)

10. Ying Xu (3 out of 3 patents)

11. Srivatsan Seshadri (2 out of 16 patents)

12. Peiping Zhu (2 out of 3 patents)

13. Ziyu Wu (2 out of 5 patents)

14. Qingxi Yuan (2 out of 2 patents)

15. Wanxia Huang (2 out of 2 patents)

38 patents: Sort by Forward Citations

1. 8526575 - Compound X-ray lens having multiple aligned zone plates (2013-09-03),

2. 8353628 - Method and system for tomographic projection correction (2013-01-15),

3. 8267388 - Alignment assembly (2012-09-18),

4. 8139846 - Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy (2012-03-20),

5. 8068579 - Process for examining mineral samples with X-ray microscope and projection systems (2011-11-29),

6. 7974379 - Metrology and registration system and method for laminography and tomography (2011-07-05),

7. 7920676 - CD-GISAXS system and method (2011-04-05),

8. 7864426 - High aspect-ratio X-ray diffractive structure stabilization methods and systems (2011-01-04),

9. 7813475 - X-ray microscope with switchable x-ray source (2010-10-12),

10. 7800072 - Low pass X-ray scintillator system (2010-09-21),

11. 7796725 - Mechanism for switching sources in x-ray microscope (2010-09-14),

12. 7787588 - System and method for quantitative reconstruction of Zernike phase-contrast images (2010-08-31),

13. 7561662 - X-ray micro-tomography system optimized for high resolution, throughput, image quality (2009-07-14),

14. 7535193 - Five axis compensated rotating stage (2009-05-19),

15. 7499521 - System and method for fuel cell material x-ray analysis (2009-03-03),

Xradia, Inc. is a leading provider of 3D X-ray microscopy solutions for advanced imaging and analysis of materials in academic and industrial research environments. With their high-resolution and high-contrast imaging technologies, Xradia's products enable researchers to visualize and quantify microstructures in a non-destructive manner. Their solutions are widely used in various fields including materials science, life sciences, electronics, and more, empowering scientists and engineers to make breakthrough discoveries and innovations.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

38 Patents

#6 in Concord, CA

#2,126 in California

#9,007 in US

#17,788 in the World

Concord, CA, United States of America

Xradia, Inc.

Forward Citations = 1,804

26 inventors:

Wenbing Yun (35 out of 93 patents)

Yuxin Wang (24 out of 24 patents)

Michael Feser (9 out of 17 patents)

4. Frederick William Duewer (8 out of 8 patents)

5. David D Scott (6 out of 63 patents)

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