The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Nov. 05, 2008
Michael A. Bajura, Arlington, VA (US);
John N. Damoulakis, Gambrills, MD (US);
Younes Boulghassoul, Arlington, VA (US);
Michael P. K. Feser, Concord, CA (US);
Andrei V. Tkachuk, Concord, CA (US);
Michael A. Bajura, Arlington, VA (US);
John N. Damoulakis, Gambrills, MD (US);
Younes Boulghassoul, Arlington, VA (US);
Michael P. K. Feser, Concord, CA (US);
Andrei V. Tkachuk, Concord, CA (US);
University of Southern California, Los Angeles, CA (US);
Xradia, Concord, CA (US);
Abstract
A method and system for verifying the integrity of integrated circuits (ICs) by detecting the presence of unauthorized circuit insertions or modifications using non-destructive x-ray microscopy is disclosed. A reference image based on a trusted IC or a trusted design file may be generated. An un-trusted IC may be received from an un-trusted foundry, which IC is manufactured in response to the trusted design file provided to the foundry. An x-ray microscope may record a plurality of sets of base images of the un-trusted IC, each set corresponding to a different viewing angle. One or more un-trusted images may be produced from the base images. The reference images may be compared with the un-trusted images to illuminate any additions or modifications in circuit elements or other parameters.