The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Mar. 11, 2009
Ziyu Wu, Beijing, CN;
Wenbing Yun, Walnut Creek, CA (US);
Peiping Zhu, Beijing, CN;
Yuxin Wang, Northbrook, IL (US);
Qingxi Yuan, Beijing, CN;
Andrei Tkachuk, Walnut Creek, CA (US);
Wanxia Huang, Beijing, CN;
Michael Feser, Walnut Creek, CA (US);
Ziyu Wu, Beijing, CN;
Wenbing Yun, Walnut Creek, CA (US);
Peiping Zhu, Beijing, CN;
Yuxin Wang, Northbrook, IL (US);
Qingxi Yuan, Beijing, CN;
Andrei Tkachuk, Walnut Creek, CA (US);
Wanxia Huang, Beijing, CN;
Michael Feser, Walnut Creek, CA (US);
Xradia, Inc., Concord, CA (US);
Abstract
An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.