The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Apr. 09, 2009
Wenbing Yun, Walnut Creek, CA (US);
Michael Feser, Walnut Creek, CA (US);
Andrei Tkachuk, Walnut Creek, CA (US);
Thomas A. Case, Walnut Creek, CA (US);
Frederick W. Duewer, Albany, CA (US);
Hauyee Chang, Berkeley, CA (US);
Wenbing Yun, Walnut Creek, CA (US);
Michael Feser, Walnut Creek, CA (US);
Andrei Tkachuk, Walnut Creek, CA (US);
Thomas A. Case, Walnut Creek, CA (US);
Frederick W. Duewer, Albany, CA (US);
Hauyee Chang, Berkeley, CA (US);
Xradia, Inc., Pleasanton, CA (US);
Abstract
A process to determine the porosity and/or mineral content of mineral samples with an x-ray CT system is described. Based on the direct-projection techniques that use a spatially-resolved x-ray detector to record the x-ray radiation passing through the sample, 1 micrometer or better resolution is achievable. Furthermore, by using an x-ray objective lens to magnify the x-ray image in a microscope configuration, a higher resolution of up to 50 nanometers or more is achieved with state-of-the-art technology. These x-ray CT techniques directly obtain the 3D structure of the sample with no modifications to the sample being necessary. Furthermore, fluid or gas flow experiments can often be conducted during data acquisition so that one may perform live monitoring of the physical process in 3D.