Company Filing History:
Years Active: 2006-2013
Title: **Celebrating the Innovations of Frederick William Duewer**
Introduction
Frederick William Duewer, an accomplished inventor based in Albany, CA, has made significant contributions to the field of x-ray microscopy and tomography. With a portfolio of eight patents, Duewer has developed innovative methods and systems that enhance the accuracy and efficiency of imaging techniques, particularly in the analysis of mineral samples.
Latest Patents
Among his notable contributions, Frederick Duewer's latest patents include:
1. **Method and System for Tomographic Projection Correction** - This patent involves a sophisticated approach where the position of a sample is measured to correct off-axis motion during tomography with an x-ray projection microscope system. Utilizing a precision-machined, low-CTE gold-coated cylinder or disc, along with capacitive distance sensors, the method allows for image processing corrections in software, effectively improving the quality of x-ray projections. Regular calibration ensures the accuracy and reliability of the system.
2. **Process for Examining Mineral Samples with X-ray Microscope and Projection Systems** - This innovative process focuses on determining the porosity and mineral content of samples using an x-ray CT system. With the ability to achieve a resolution of 1 micrometer or better through direct-projection techniques, and even up to 50 nanometers with advanced x-ray objectives, Duewer's work facilitates live monitoring of physical processes in 3D without requiring modifications to the samples.
Career Highlights
Frederick has had a distinguished career at Xradia, Inc., a leading company in the field of x-ray imaging technologies. His expertise in optical systems and imaging science has played a vital role in advancing the company's innovative solutions. Duewer's patents contribute to the ongoing development of superior imaging techniques, benefiting various applications in research and industry.
Collaborations
Throughout his career, Frederick has collaborated with talented individuals, including Wenbing Yun and Yuxin Wang. These partnerships have fostered an environment of innovation and creativity, allowing for the exchange of ideas and expertise that drive the development of state-of-the-art imaging technologies.
Conclusion
Frederick William Duewer exemplifies the spirit of innovation that drives progress in technology. With his impressive array of patents and continued contributions to the field of x-ray microscopy, Duewer's work not only enhances scientific understanding but also paves the way for future advancements in mineral analysis and imaging techniques. His dedication to improving x-ray systems reflects a commitment to excellence that resonates throughout his career.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.