The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Jan. 14, 2005
Wenbing Yun, Walnut Creek, CA (US);
David Dean Scott, Oakland, CA (US);
David R. Trapp, Tracy, CA (US);
Frederick William Duewer, Albany, CA (US);
Yuxin Wang, Arlington Heights, IL (US);
Wenbing Yun, Walnut Creek, CA (US);
David Dean Scott, Oakland, CA (US);
David R. Trapp, Tracy, CA (US);
Frederick William Duewer, Albany, CA (US);
Yuxin Wang, Arlington Heights, IL (US);
Xradia, Inc., Concord, CA (US);
Abstract
A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.