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Suss Microtec Test Systems Gmbh

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USPTO Granted Patents = 21

% Expired Patents = 52.4

Forward Citations = 85

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34 inventors (with patents filed for the assignee):

Stojan Kanev (13 out of 28 patents)

Stefan Kreissig (10 out of 13 patents)

Claus Dietrich (7 out of 13 patents)

4. Jorg Kiesewetter (6 out of 8 patents)

5. Axel Schmidt (5 out of 10 patents)

6. Stefan Schneidewind (5 out of 7 patents)

7. Steffen Schott (4 out of 5 patents)

8. Dietmar Runge (4 out of 6 patents)

9. Karsten Stoll (3 out of 11 patents)

10. Hans-Jurgen Fleischer (3 out of 6 patents)

11. Joerg Kiesewetter (3 out of 7 patents)

12. Jörg Kiesewetter (3 out of 5 patents)

13. Axel Becker (2 out of 9 patents)

14. Frank-Michael Werner (2 out of 6 patents)

15. Michael Teich (2 out of 19 patents)

21 patents: Sort by Forward Citations

1. 7859278 - Probe holder for a probe for testing semiconductor components (2010-12-28),

2. 7769555 - Method for calibration of a vectorial network analyzer (2010-08-03),

3. 7768271 - Method for calibration of a vectorial network analyzer having more than two ports (2010-08-03),

4. 7741860 - Prober for testing magnetically sensitive components (2010-06-22),

5. 7733108 - Method and arrangement for positioning a probe card (2010-06-08),

6. 7659743 - Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer (2010-02-09),

7. 7652491 - Probe support with shield for the examination of test substrates under use of probe supports (2010-01-26),

8. 7579854 - Probe station and method for measurements of semiconductor devices under defined atmosphere (2009-08-25),

9. 7579849 - Probe holder for a probe for testing semiconductor components (2009-08-25),

10. 7573283 - Method for measurement of a device under test (2009-08-11),

11. 7560942 - Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus (2009-07-14),

12. 7463044 - Adapter for positioning of contact tips (2008-12-09),

13. 7332923 - Test probe for high-frequency measurement (2008-02-19),

14. 7282930 - Device for testing thin elements (2007-10-16),

15. 7265536 - Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station (2007-09-04),

Company Overview

Suss Microtec Test Systems GmbH, based in Sacka, Germany, specializes in advanced semiconductor manufacturing solutions. The company focuses on developing innovative test systems that enhance the efficiency and reliability of microelectronic components. With expertise in areas such as photolithography, wafer bonding, and packaging, Suss Microtec plays a crucial role in the semiconductor supply chain. Their technologies are integral to various applications, supporting industries that demand high precision and performance in electronic devices.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

21 Patents

#1 in

#2,133 in Germany

#30,001 in the World

Suss Microtec Test Systems Gmbh

Forward Citations = 85

34 inventors:

Stojan Kanev (13 out of 28 patents)

Stefan Kreissig (10 out of 13 patents)

Claus Dietrich (7 out of 13 patents)

4. Jorg Kiesewetter (6 out of 8 patents)

5. Axel Schmidt (5 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Suss Microtec Test Systems Gmbh. Retrieved from https://idiyas.com/company/suss-microtec-test-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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