The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Dec. 08, 2008
Stojan Kanev, Thiendorf OT Sacka, DE;
Hans-jurgen Fleischer, Preistewitz, DE;
Stefan Kressig, Venusberg, DE;
Jorg Kiesewetter, Thiendorf OT Sacka, DE;
Stojan Kanev, Thiendorf OT Sacka, DE;
Hans-Jurgen Fleischer, Preistewitz, DE;
Stefan Kressig, Venusberg, DE;
Jorg Kiesewetter, Thiendorf OT Sacka, DE;
SUSS Microtec Test Systems GmbH, Sacka, DE;
Abstract
A method for perpendicular positioning of a probe card relative to a test substrate, includes storing a separation position approached in a first positioning step as a distance between the needle tips of the probe card and the substrate, storing a contact position approached in a second positioning step until the probe card contacts the substrate, and displaying an image of the needle tips. For avoiding erroneous operation after a probe card has been changed, when imaging the needle tips, the stored contact position is imaged and is changed until presentation of this contact position corresponds to actual height of the tips appropriate for the respective probe card and this setting is then stored as a new contact position. A display device presents the needle tips and the stored contact position and is connected to a memory, a recording device and an input device which changes the contact position.