Ann Arbor, MI, United States of America

Picometrix, Inc.

USPTO Granted Patents = 21

% Expired Patents = 4.8



Trademarks = 2

Forward Citations = 163

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18 inventors (with patents filed for the assignee):

goldMedal Steven L Williamson (12 out of 22 patents)

silverMedal David Zimdars (10 out of 11 patents)

bronzeMedal Cheng C Ko (4 out of 4 patents)

4.  Barry Levine (4 out of 5 patents)

5.  Jeffrey S White (4 out of 9 patents)

6.  James V Rudd (3 out of 3 patents)

7.  Irl Duling (2 out of 2 patents)

8.  Gregory D Fichter (2 out of 2 patents)

9.  Robert N Sacks (2 out of 2 patents)

10.  Artur Chernovsky (2 out of 2 patents)

11.  Matthew W Warmuth (2 out of 4 patents)

12.  Matthew M Jazwiecki (1 out of 2 patents)

13.  Timothy Strong (1 out of 1 patent)

14.  Gregory Stuk (1 out of 1 patent)

15.  Klaus Wolter (1 out of 1 patent)


21 patents:

Company Overview
Picometrix, Inc. is a technology company based in Ann Arbor, Michigan, specializing in advanced photonics and optical technologies. The company focuses on developing high-performance solutions for a variety of applications, including telecommunications, automotive, and industrial sectors. With a strong emphasis on research and innovation, Picometrix aims to enhance data transmission capabilities and improve system performance through cutting-edge optical components and systems. Their expertise positions them as a key player in the evolving landscape of optical technology.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

21 Patents

#41 in Ann Arbor, MI

#571 in Michigan

#15,712 in US

#30,001 in the World

Ann Arbor, MI (US)
Ann Arbor, MI, United States of America
Forward Citations = 163

18 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Picometrix, Inc.. Retrieved from https://idiyas.com/company/picometrix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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