The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Jul. 14, 2008
Jeffrey S. White, Manchester, MI (US);
Gregory D. Fichter, Ann Arbor, MI (US);
David Zimdars, Ann Arbor, MI (US);
Steven Williamson, Ann Arbor, MI (US);
Jeffrey S. White, Manchester, MI (US);
Gregory D. Fichter, Ann Arbor, MI (US);
David Zimdars, Ann Arbor, MI (US);
Steven Williamson, Ann Arbor, MI (US);
Picometrix, LLC, Ann Arbor, MI (US);
Abstract
A system and method to measure, with increased precision, the transit time position(s) of pulses in a time domain data. An example data set would be the transit time of pulses in Time-Domain Terahertz (TD-THz) data. The precision of the pulse timing directly affects the precision of determined sample properties measurements (e.g., thickness). Additionally, an internal calibration etalon structure and algorithm method provides for continuous system precision/accuracy check method to increase sample measurement integrity. The etalon structure can improve the precision of sample property measurements (e.g., absolute thickness). Various hardware and system implementations of the above are described.