CIPO Patents = 6 (Patent Applications = 1)

EPO Patents = 4 (Patent Applications = 1)

Average Co-Inventor Count = 2.3

ph-index = 6

Forward Citations = 2,755(Granted Patents)

Location History:

Ridgefield, CT (US) (1993 - 2005)
Manchester, MI (US) (2013 - 2019)

Company Filing History:

5 out of 1,184

United States Surgical Corporation

where one patent can have more than one assignee

Years Active: 1993-2019

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9 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10215696 - System for determining at least one property of a sheet dielectric sample using terahertz radiation (2019-02-26),

2. 9588041 - System and method for detection and measurement of interfacial properties in single and multilayer objects (2017-03-07),

3. 9360296 - System for calculation of material properties using reflection terahertz radiation and an external reference structure (2016-06-07),

4. 8457915 - System and method to measure the transit time position(s) of pulses in time domain data (2013-06-04),

5. 6869439 - Ultrasonic dissector (2005-03-22),

6. 5522817 - Absorbable surgical fastener with bone penetrating elements (1996-06-04),

7. 5415631 - Endoscopic material delivery device (1995-05-16),

8. 5312333 - Endoscopic material delivery device (1994-05-17),

9. 5188092 - Disposable rigid endoscope (1993-02-23),

Title: The Innovative Contributions of Jeffrey S. White

Introduction

Jeffrey S. White is a notable inventor based in Ridgefield, CT, who has made significant contributions to the field of material science and electromagnetic radiation. With a total of 9 patents to his name, his work focuses on advanced systems for analyzing and measuring material properties.

Latest Patents

One of his latest patents is titled "System for determining at least one property of a sheet dielectric sample using terahertz radiation." This innovative system includes a terahertz transmitter that outputs a pulse of terahertz radiation and a receiver that captures the radiation, allowing for the analysis of dielectric samples. The control unit in this system is designed to optimize the comparison between measured and model waveforms, enhancing the accuracy of property determination.

Another significant patent is the "System and method for detection and measurement of interfacial properties in single and multilayer objects." This system utilizes electromagnetic radiation to assess material properties at the interface of different layers, specifically focusing on adhesive strength. The data acquisition device digitizes the electromagnetic radiation, providing valuable waveform data for analysis.

Career Highlights

Throughout his career, Jeffrey has worked with prominent companies such as United States Surgical Corporation and Picometrix, Inc. His experience in these organizations has contributed to his expertise in the field and has facilitated the development of his innovative patents.

Collaborations

Jeffrey has collaborated with notable individuals in his field, including David Zimdars and Robert W. Churinetz. These collaborations have likely enriched his work and expanded the impact of his inventions.

Conclusion

Jeffrey S. White's contributions to the field of material science through his innovative patents demonstrate his commitment to advancing technology. His work continues to influence the industry and pave the way for future developments.

This text is generated by artificial intelligence and may not be accurate.