The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Oct. 18, 2013
Applicant:
Picometrix, Llc, Ann Arbor, MI (US);
Inventors:
Jeffrey S. White, Manchester, MI (US);
David Zimdars, Ann Arbor, MI (US);
Assignee:
PICOMETRIX, LLC, Ann Arbor, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/35 (2014.01); H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02001 (2013.01); H04J 14/02 (2013.01);
Abstract
A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to output a signal based on the radiation received by the terahertz receiver.
White, Jeffrey. (2016). System for calculation of material properties using reflection terahertz radiation and an external reference structure (U.S. Patent No. 9360296). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9360296
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile