The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Oct. 13, 2010
Jeffrey S. White, Manchester, MI (US);
Gregory D. Fichter, Ann Arbor, MI (US);
Irl Duling, Ann Arbor, MI (US);
David Zimdars, Ann Arbor, MI (US);
Jeffrey S. White, Manchester, MI (US);
Gregory D. Fichter, Ann Arbor, MI (US);
Irl Duling, Ann Arbor, MI (US);
David Zimdars, Ann Arbor, MI (US);
PICOMETRIX, LLC, Ann Arbor, MI (US);
Abstract
A system for determining a material property at an interface between a first layer and a second layer includes a transmitter outputting electromagnetic radiation to the sample, a receiver receiving electromagnetic radiation that was reflected by or transmitted though the sample, and a data acquisition device. The data acquisition device digitizes the electromagnetic radiation to yield waveform data. The waveform data represents the radiation reflected by or transmitted though the sample. The material property to be determined is generally the adhesive strength between the first and second layers.