For the Inventor, By the Inventor

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Boulder, CO, United States of America

Particle Measuring Systems, Inc.

Calculating rank

USPTO Granted Patents = 94

% Expired Patents = 2.1

EPO Patents = 14

Trademarks = 23

Forward Citations = 3,606

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73 inventors (with patents filed for the assignee):

Brian A Knollenberg (24 out of 22 patents)

Daniel Rodier (17 out of 15 patents)

Robert G Knollenberg (14 out of 15 patents)

4. Davide Recchia (11 out of 9 patents)

5. Dwight A Sehler (11 out of 11 patents)

6. Thomas A Bates (10 out of 10 patents)

7. Ronald W Adkins (10 out of 6 patents)

8. Todd A Cerni (8 out of 8 patents)

9. Matt Michaelis (7 out of 7 patents)

10. Brett Haley (7 out of 7 patents)

11. John R Mitchell (7 out of 7 patents)

12. Giovanni Scialo (7 out of 5 patents)

13. Cliff Ketcham (5 out of 9 patents)

14. James M Lumpkin (5 out of 5 patents)

15. Scott Waisanen (5 out of 5 patents)

Core Competencies:

Particle Detection

Aerosol Measurement

Filtration Systems

Nanoparticle Detection

Robotic Control

Optical Particle Sensors

Cleanroom Environments

Calibration Verification

Condensation Particle Counters

Fluid Manifolds

Slurry Quality Control

Microbial Air Samplers

94 patents: Sort by Forward Citations

1. 12461010 - Systems and methods for reducing false positive particle detection events in a particle detector (2025-11-04),

2. 12422341 - Compact intelligent aerosol and fluid manifold (2025-09-23),

3. 12399114 - Modular particle counter with docking station (2025-08-26),

4. 12399102 - System and method for particles measurement (2025-08-26),

5. 12399089 - Liquid impinger sampling systems and methods (2025-08-26),

6. 12352671 - Particle sampling systems and methods for robotic controlled manufacturing barrier systems (2025-07-08),

7. 12326393 - Enhanced dual-pass and multi-pass particle detection (2025-06-10),

8. 12313514 - Detection scheme for particle size and concentration measurement (2025-05-27),

9. 12276592 - Particle detection via scattered light combined with incident light (2025-04-14),

10. 12270817 - Robotic control for aseptic processing (2025-04-08),

11. 12231890 - User access-restrictive systems and methods for operating particle sampling devices (2025-02-18),

12. 12130222 - Condensation particle counters and methods of use (2024-10-29),

13. 11988593 - Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions (2024-05-21),

14. 11946852 - Particle detection systems and methods for on-axis particle detection and/or differential detection (2024-04-02),

15. 11927509 - Particle sampling systems and methods for robotic controlled manufacturing barrier systems (2024-03-12),

Company Overview

Particle Measuring Systems, Inc. is a leading provider of advanced particle detection technologies, specializing in aerosol measurement and filtration systems. Based in Boulder, Colorado, the company focuses on developing innovative solutions for cleanroom environments, ensuring optimal air quality and contamination control. Their expertise extends to nanoparticle detection and robotic control, utilizing optical particle sensors to enhance precision in various applications. The organization is committed to delivering reliable calibration verification methods to support industries requiring stringent cleanliness standards.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

94 Patents

#16 in Boulder, CO

#81 in Colorado

#3,987 in US

#8,211 in the World

Boulder, CO, United States of America

Particle Measuring Systems, Inc.

Forward Citations = 3,606

73 inventors:

Brian A Knollenberg (24 out of 22 patents)

Daniel Rodier (17 out of 15 patents)

Robert G Knollenberg (14 out of 15 patents)

4. Davide Recchia (11 out of 9 patents)

5. Dwight A Sehler (11 out of 11 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Particle Measuring Systems, Inc.. Retrieved from https://idiyas.com/company/particle-measuring-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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