The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Nov. 14, 2024
Particle Measuring Systems, Inc., Boulder, CO (US);
Joseph Thomas Cilke, Boulder, CO (US);
Brett Haley, Boulder, CO (US);
Scott Maclaughlin, Boulder, CO (US);
Brian A. Knollenberg, Boulder, CO (US);
Benjamin Martinez, Boulder, CO (US);
Clayton Ellinwood, Boulder, CO (US);
Particle Measuring Systems, Inc., Boulder, CO (US);
Abstract
A method for reducing false-positive particle detection events of an optical particle detection system includes: filtering raw particle count data to produce filtered particle count data. The filtering includes: temporarily storing the raw particle count data for a buffering time period; segmenting the raw particle count data into a series of elemental data intervals; examining each elemental data interval for a noise signature; identifying a noise signature in the segmented raw particle count data; in response to the identified noise signature, flagging one or more sequential elemental data intervals as corresponding to a noise event; and removing the one or more flagged elemental data intervals from the raw particle count data to produce the filtered particle count data, and/or generating replacement data and substituting the replacement data for the one or more flagged elemental data intervals to produce the filtered particle count data.