The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Jun. 14, 2022
Applicant:
Particle Measuring Systems, Inc., Boulder, CO (US);
Inventors:
Edward Yates, Boulder, CO (US);
Cary Hertert, Boulder, CO (US);
Brian A. Knollenberg, Boulder, CO (US);
Jonathan Skuba, Boulder, CO (US);
Assignee:
PARTICLE MEASURING SYSTEMS, INC., Boulder, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/26 (2006.01);
U.S. Cl.
CPC ...
G01N 1/26 (2013.01);
Abstract
A manifold system and methods of collecting samples, where the manifold system comprises multiple input sample ports and a preferably rotatable flow focusing element. The manifold system is able to sample aerosols and gases from multiple sample points, such as from cleanrooms and manufacturing environments, for collection and analysis. The flow focusing element reduces cross talk and cross contamination of particles, including nanoparticles, between different samples.