Company Filing History:
Years Active: 2001-2007
Title: Innovations and Contributions of Inventor Scott Waisanen
Introduction
Scott Waisanen, located in Louisville, Colorado, is a prominent inventor with a total of five patents to his name. His work primarily focuses on advancements in measurement technologies, particularly in the semiconductor industry. With a keen interest in enhancing quality control processes, Waisanen has made significant contributions that have far-reaching implications for manufacturing and quality assurance.
Latest Patents
Among Waisanen's latest inventions are two notable patents that address critical challenges in chemical mechanical planarization (CMP). The first patent details a quality control process for CMP slurry, employing a sensitive particle distribution probe that integrates a modified Twomey/Chahine iterative convergence technique. This innovative design allows for precise particle size distribution measurements from optically dense slurries used in semiconductor fabrication. Waisanen's system utilizes spectral transmission data across a spectral range of 0.20-2.5 microns, featuring specially constructed sample cells and miniature, fixed grating, linear detector array spectrometers. The invention facilitates continuous, real-time sampling of undiluted slurry, thereby enhancing quality control in an industrial setting.
The second patent highlights a system and method for measuring molecular analytes in a measurement fluid. This molecular contamination monitoring system incorporates a piezoelectric measurement sensor and reference sensor, both exposed to the same environmental conditions. This design enables accurate detection of molecular constituents, thereby improving the reliability of analytical measurements.
Career Highlights
Scott Waisanen is currently affiliated with Particle Measuring Systems, where he applies his expertise to drive innovation in measurement technologies. His contributions have positioned him as a key figure in the industry, particularly in advancing quality control methods that are essential for semiconductor manufacturing.
Collaborations
Throughout his career, Waisanen has collaborated with talented individuals such as Todd A. Cerni and Daniel Rodier, furthering the impact and reach of his inventions. These partnerships underscore the significance of teamwork in fostering innovation and solving complex industrial challenges.
Conclusion
Scott Waisanen's inventive spirit and dedication to enhancing measurement technologies have resulted in valuable patents that contribute significantly to the semiconductor industry. His work exemplifies how targeted innovations can lead to improved quality control processes, showcasing the importance of continuous development in technology for industrial applications.