The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jun. 07, 2021
Applicant:

Particle Measuring Systems, Inc., Boulder, CO (US);

Inventor:

Daniel Rodier, Boulder, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/1434 (2023.12); G01N 15/0205 (2023.12);
U.S. Cl.
CPC ...
G01N 15/1434 (2012.12); G01N 15/0211 (2012.12); G01N 2015/1454 (2012.12);
Abstract

Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.


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