The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

Dec. 30, 2021
Applicant:

Particle Measuring Systems, Inc., Boulder, CO (US);

Inventors:

Giovanni Scialo, Frascati, IT;

Davide Recchia, Frascati, IT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); G01N 1/02 (2006.01); G01N 15/06 (2006.01); G01N 15/14 (2006.01); G01N 35/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/2247 (2013.01); G01N 1/02 (2013.01); G01N 1/2202 (2013.01); G01N 15/0606 (2013.01); G01N 15/1459 (2013.01); G01N 35/0099 (2013.01); G01N 2001/2223 (2013.01); G01N 2001/2291 (2013.01); G01N 2015/0046 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1486 (2013.01);
Abstract

Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.


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