The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jan. 06, 2022
Applicant:
Particle Measuring Systems, Inc., Boulder, CO (US);
Inventor:
Joseph Shamir, Haifa, IL;
Assignee:
PARTICLE MEASURING SYSTEMS, INC., Boulder, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/0205 (2024.01); G01N 15/06 (2024.01); G01N 15/14 (2024.01); G01N 15/1434 (2024.01); G01N 15/075 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 15/06 (2013.01); G01N 15/1434 (2013.01); G01N 15/1436 (2013.01); G01N 15/1456 (2013.01); G01N 15/1459 (2013.01); G01N 15/075 (2024.01); G01N 2015/145 (2013.01); G01N 2015/1454 (2013.01);
Abstract
The present invention provides a system and method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, structured laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration.