The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Nov. 20, 2020
Particle Measuring Systems, Inc., Boulder, CO (US);
Timothy A Ellis, Boulder, CO (US);
Chris Bonino, Boulder, CO (US);
Brian A. Knollenberg, Boulder, CO (US);
James Lumpkin, Boulder, CO (US);
Daniel Rodier, Boulder, CO (US);
Dwight Sehler, Boulder, CO (US);
Mehran Vahdani Moghaddam, Boulder, CO (US);
Thomas Ramin, Boulder, CO (US);
PARTICLE MEASURING SYSTEMS, INC., Boulder, CO (US);
Abstract
The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.