Boulder, CO, United States of America

Chris Bonino

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Particle Measuring Systems, Inc.. Active years: 2024.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Chris Bonino: Innovator in Particle Detection Technology

Introduction

Chris Bonino is a notable inventor based in Boulder, Colorado. He has made significant contributions to the field of particle detection, particularly through his innovative patent that addresses the challenges associated with detecting small particles.

Latest Patents

Chris Bonino holds a patent titled "Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions." This invention focuses on the interferometric detection of particles and optical detection of particles that are less than or equal to 100 nm in size. The systems and methods he developed exhibit enhanced alignment and stability, which are crucial for accurate particle detection. Additionally, his invention includes compensation mechanisms to mitigate the effects of internal and external stimuli that can compromise the sensitivity and reliability of detection methods.

Career Highlights

Chris Bonino is associated with Particle Measuring Systems, Inc., where he applies his expertise in particle detection technologies. His work has been instrumental in advancing the capabilities of optical detection systems, making them more reliable and effective in various applications.

Collaborations

Throughout his career, Chris has collaborated with talented individuals such as Timothy A. Ellis and Brian A. Knollenberg. These collaborations have contributed to the development of innovative solutions in the field of particle measurement.

Conclusion

Chris Bonino's contributions to the field of particle detection through his innovative patent demonstrate his commitment to advancing technology in this area. His work continues to influence the development of reliable detection systems for small particles.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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