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The Ncs Testing Technology Co., Ltd.

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USPTO Granted Patents = 15

Forward Citations = 1

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59 inventors (with patents filed for the assignee):

Haizhou Wang (11 out of 19 patents)

Yunhai Jia (9 out of 14 patents)

Xuejing Shen (8 out of 13 patents)

4. Lei Zhao (8 out of 52 patents)

5. Dongling Li (7 out of 12 patents)

6. Liangjing Yuan (5 out of 5 patents)

7. Weihao Wan (4 out of 5 patents)

8. Lei Yu (4 out of 25 patents)

9. Xing Yu (3 out of 8 patents)

10. Qiaochu Zhang (3 out of 3 patents)

11. Liang Sheng (3 out of 3 patents)

12. Peng Wang (2 out of 111 patents)

13. Hui Wang (2 out of 214 patents)

14. Guiyong Wang (2 out of 2 patents)

15. Linmao Zhu (2 out of 2 patents)

15 patents: Sort by Forward Citations

1. 12339219 - Adaptive characteristic spectral line screening method and system based on atomic emission spectrum (2025-06-24),

2. 12326434 - Method for quantitatively characterizing dendrite segregation and dendrite spacing of high-temperature alloy ingot (2025-06-10),

3. 12270819 - Ultra-high-speed fully automatic precision spectral analysis system for rare earth metals and working method thereof (2025-04-08),

4. 12270745 - Single pulse spectral statistical analysis method for particle size distribution of inclusion on surface of metal material (2025-04-08),

5. 12203864 - Spark spectrometry for inclusions content distribution on the surface of large size metallic materials (2025-01-21),

6. 12146845 - Component residual stress testing platform based on neutron diffraction and experimental method thereof (2024-11-19),

7. 12042865 - High-throughput 3D printing system for preparing multi-component, small sized samples (2024-07-23),

8. 12019025 - Apparatus and method for preparing glow discharge sputtering samples for material microscopic characterization (2024-06-25),

9. 11971349 - Combined oxygen, nitrogen and hydrogen joint determination device and method based on thermal conductivity-infrared technique (2024-04-30),

10. 11927511 - Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy (2024-03-12),

11. 11906474 - High-throughput and small size samples tension, compression, bending test system and method thereof (2024-02-20),

12. 11754503 - Measurement deviation correction method and system for spark discharge analysis of large-size metal material (2023-09-12),

13. 11506650 - Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials (2022-11-22),

14. 11193867 - System and method for high-throughput test of mechanical properties of miniature specimens (2021-12-07),

15. 10804073 - Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structure (2020-10-13),

Company Overview

The Ncs Testing Technology Co., Ltd. is a prominent player in the field of testing and measurement technology, specializing in the development and manufacturing of advanced testing equipment and solutions. Based in Beijing, the company focuses on various domains including electronic testing, material analysis, and quality assurance, catering to a diverse range of industries. Ncs Testing Technology is committed to innovation and precision, providing reliable tools that enhance product performance and safety in the global market.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

15 Patents

#201 in Beijing

#1,927 in China

#40,018 in the World

The Ncs Testing Technology Co., Ltd.

Forward Citations = 1

59 inventors:

Haizhou Wang (11 out of 19 patents)

Yunhai Jia (9 out of 14 patents)

Xuejing Shen (8 out of 13 patents)

4. Lei Zhao (8 out of 52 patents)

5. Dongling Li (7 out of 12 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: The Ncs Testing Technology Co., Ltd.. Retrieved from https://idiyas.com/company/ncs-testing-technology-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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