The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Sep. 01, 2020
The Ncs Testing Technology Co., Ltd., Beijing, CN;
Dongling Li, Beijing, CN;
Weihao Wan, Beijing, CN;
Jie Li, Beijing, CN;
Haizhou Wang, Beijing, CN;
Lei Zhao, Beijing, CN;
Xuejing Shen, Beijing, CN;
Yunhai Jia, Beijing, CN;
THE NCS TESTING TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The invention belongs to the technical field of quantitative statistical distribution analysis for micro-structures of metal materials, and relates to a method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials. According to the method based on deep learning in the present invention, dendrite structure feature maps are marked and trained to obtain a corresponding object detection model, so as to carry out automatic identification and marking of dendrite structure centers in a full view field; and in combination with an image processing method, feature parameters in the full view field such as morphology, position, number and spacing of all dendrite structures within a large range are obtained quickly, thereby achieving quantitative statistical distribution characterization of dendrite structures in the metal material. The method is accurate, automatic and efficient, involves a large amount of quantitative statistical distribution information, and is statistically more representative as compared with the traditional measurement of feature sizes of dendrite structures in a single view field.