The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Jan. 27, 2022
Ncs Testing Technology Co., Ltd, Beijing, CN;
Central Iron and Steel Research Institute, Beijing, CN;
Dongling Li, Beijing, CN;
Lei Zhao, Beijing, CN;
Haizhou Wang, Beijing, CN;
Xuejing Shen, Beijing, CN;
Qingqing Zhou, Beijing, CN;
Weihao Wan, Beijing, CN;
Haozhou Feng, Beijing, CN;
NCS TESTING TECHNOLOGY CO., LTD, Beijing, CN;
CENTRAL IRON AND STEEL RESEARCH INSTITUTE, Beijing, CN;
Abstract
The present application relates to a method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy, and relates to the technical field of analysis of metal material composition and microstructure, comprising the following steps: step 1, processing a to-be-tested sample and determining a calibration coefficient; step 2, obtaining a two-dimensional element content distribution map of the to-be-tested sample; and step 3, determining the number and average spacing of primary dendrites. A composition distribution region analyzed in the present application is larger than the area of a distribution region of the traditional microscopic analysis method, and the sample preparation is simple. The distribution, number and average spacing of the primary dendrites can be obtained without metallographic corrosion sampling. Therefore, the present invention has the advantages of large statistical field of view, high efficiency and complete information, and the statistical data is more accurate and reliable.