This inventor holds 1 USPTO granted patent. Top assignees: Central Iron and Steel Research Institute, The Ncs Testing Technology Co., Ltd.. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Haozhou Feng: Innovator in Dendritic Structure Analysis
Introduction
Haozhou Feng is a prominent inventor based in Beijing, China. He has made significant contributions to the field of material science, particularly in the analysis of metal material composition and microstructure. His innovative approach has led to the development of a unique method for characterizing dendritic structures in single crystal superalloys.
Latest Patents
Haozhou Feng holds a patent titled "Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy." This patent outlines a method that includes several steps: processing a to-be-tested sample, determining a calibration coefficient, obtaining a two-dimensional element content distribution map, and determining the number and average spacing of primary dendrites. The advantages of this method include a larger statistical field of view, high efficiency, and more accurate and reliable statistical data. He has 1 patent to his name.
Career Highlights
Throughout his career, Haozhou Feng has worked with notable organizations, including NCS Testing Technology Co., Ltd. and the Central Iron and Steel Research Institute. His work has been instrumental in advancing the understanding of dendritic structures in superalloys, which is crucial for various industrial applications.
Collaborations
Haozhou Feng has collaborated with several professionals in his field, including Dongling Li and Lei Zhao. These collaborations have further enriched his research and contributed to the development of innovative solutions in material analysis.
Conclusion
Haozhou Feng's contributions to the field of material science, particularly through his patented method for analyzing dendritic structures, highlight his role as an influential inventor. His work continues to impact the industry positively, paving the way for advancements in material analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile