The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 18, 2022
Ncs Testing Technology Co., Ltd, Beijing, CN;
Dongling Li, Beijing, CN;
Haizhou Wang, Beijing, CN;
Xuejing Shen, Beijing, CN;
Lei Zhao, Beijing, CN;
Wenyi Cai, Beijing, CN;
Mingbo Liu, Beijing, CN;
Zongxin Liu, Beijing, CN;
Ya Peng, Beijing, CN;
NCS TESTING TECHNOLOGY CO., LTD, Beijing, CN;
Abstract
A method for quantitatively characterizing a dendrite segregation and dendrite spacing of a high-temperature alloy ingot is disclosed. The method includes preparation and surface treatment of the high-temperature alloy ingot, selection of calibration sample and determination of an element content, establishment of quantitative method for elements in micro-beam X-ray fluorescence spectrometer, quantitative distribution analysis of element components of the high-temperature alloy, quantitative characterization of characteristic element line distribution of high-temperature alloy, and analysis of a characteristic element line distribution map and statistics of a secondary dendrite spacing.