The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Jul. 24, 2024
Ncs Testing Technology Co., Ltd., Beijing, CN;
Ncs Jiangsu Testing Technology Co., Ltd., Suzhou, CN;
Yunhai Jia, Beijing, CN;
Liang Sheng, Beijing, CN;
Lei Yu, Beijing, CN;
Liangjing Yuan, Beijing, CN;
Shanshan Xu, Beijing, CN;
NCS Testing Technology Co., Ltd., Beijing, CN;
NCS Jiangsu Testing Technology Co., Ltd., Suzhou, CN;
Abstract
A single pulse spectral statistical analysis method for particle size distribution of inclusions on a surface of a metal material is provided. The method includes the following steps: analyzing a surface of an oversized metal material through single pulse discharge continuous excitation scanning to obtain mixed intensity data of spectral intensities of solid solution and inclusions of an inclusion element on the surface of the oversized metal material and a relative frequency distribution diagram; performing peak fitting processing on the relative frequency distribution diagram of the mixed spectral intensities to obtain a relative frequency distribution diagram of the spectral intensities of the inclusion; and correlating particle size information of inclusions of a small sample with distribution data of the spectral intensities of the inclusions to determine a corresponding relation between the particle sizes and the spectral intensities of the inclusions, thereby obtaining a particle size distribution result.