The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Oct. 10, 2022
Applicant:

Ncs Testing Technology Co., Ltd., Beijing, CN;

Inventors:

Jia Liu, Beijing, CN;

Feipeng Cui, Beijing, CN;

Xiaopeng Li, Beijing, CN;

Ling Liu, Beijing, CN;

Hongwei Shi, Beijing, CN;

Feifei Guo, Beijing, CN;

Ying Zhao, Beijing, CN;

Xuejing Shen, Beijing, CN;

Haizhou Wang, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G06F 18/2132 (2023.01); G06N 3/126 (2023.01);
U.S. Cl.
CPC ...
G01N 21/3103 (2013.01); G06F 18/21322 (2023.01); G06N 3/126 (2013.01); G06F 18/21326 (2023.01); G06F 2218/04 (2023.01);
Abstract

An adaptive characteristic spectral line screening method and system based on atomic emission spectrum are provided, the method includes: using a set characteristic screening optimization method to perform a plurality of optimization rounds of characteristic screening, obtaining an initialized spectral dataset of each round of the characteristic screening and initialized characteristic population genes; obtaining an optimal characteristic population gene of each round by a set analysis method, a fitness function, and an iteration of a genetic algorithm; obtaining an optimized characteristic spectral information set when the plurality of optimization rounds reach set optimization rounds; performing combination statistics and discriminant analyses on the optimized characteristic spectral information set to complete an adaptive characteristic spectral line screening. The disclosure can efficiently and automatically screen out the characteristic spectral lines that meet the analysis requirements in the complex atomic emission spectrum, thus ensuring the effectiveness and accuracy of screening the characteristic spectral lines.


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