The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Mar. 31, 2020
The Ncs Testing Technology Co., Ltd., Beijing, CN;
Guiyong Wang, Beijing, CN;
Haizhou Wang, Beijing, CN;
Linmao Zhu, Beijing, CN;
Zhigang Yang, Beijing, CN;
Peng Wang, Beijing, CN;
Tiezhu Zhu, Beijing, CN;
Lei Zhao, Beijing, CN;
Dongling Li, Beijing, CN;
THE NCS TESTING TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present invention relates to a test system and method capable of simultaneously carrying out a high-throughput test of mechanical properties for miniature specimens. The system comprises one workstation () and a plurality of specimen test modules () installed horizontally or vertically on a workbench (), wherein the workstation () comprises an operation interface, a data processing unit and a load output unit; each specimen test module () comprises a drive unit (), an interchangeable clamp unit (), a displacement sensor (), and a load sensor (); the workstation () controls the drive unit () of the specimen test module () and receives detection data of the displacement sensor () and the load sensor (); each specimen test module () optionally performs mechanical property testing independently; and the workstation () controls simultaneously started testing of a plurality of specimens (). The present invention can achieve tensile, bending, compression bending, stress-rupture, relaxation, and fatigue strength tests on a plurality of specimens at the same time.