The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Dec. 16, 2022
Applicant:

Ncs Testing Technology Co.,ltd, Beijing, CN;

Inventors:

Yunhai Jia, Beijing, CN;

Liang Sheng, Beijing, CN;

Liangjing Yuan, Beijing, CN;

Lei Yu, Beijing, CN;

Qiaochu Zhang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/67 (2006.01); G01J 3/06 (2006.01); G01J 3/457 (2006.01); G01N 21/31 (2006.01); G01N 21/88 (2006.01); G01N 21/93 (2006.01); G01N 33/2022 (2019.01);
U.S. Cl.
CPC ...
G01N 21/67 (2013.01); G01J 3/06 (2013.01); G01J 3/457 (2013.01); G01N 21/31 (2013.01); G01N 21/8851 (2013.01); G01N 21/93 (2013.01); G01N 33/2022 (2019.01); G01J 2003/061 (2013.01); G01N 2021/3196 (2013.01);
Abstract

A spark spectrometry for inclusions content distribution on the surface of large size metallic materials, comprising the following steps: analyzing the surface of large-size metallic materials by spark discharge continuous excitation scanning, obtaining a mixture intensity distribution data of the solid solution and inclusions of an element on the surface of the large-size metallic materials; the relative frequency distribution diagram of spectral intensity is subjected to peak fitting of normal distribution and Gumbel distribution, obtaining an extreme value distribution data of spectral intensity of the inclusions; a size information of the inclusions in a small sample and that of the largest inclusions are correlated with the spectral intensity distribution data of inclusions, obtaining a result of content distribution of the inclusions on the surface of the large size metallic materials. The invention can quickly obtain accurate distribution information of inclusions of various elements on the surface of metallic materials.


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