Forward Citations = 87

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7 inventors (with patents filed for the assignee):

Bart Van Coppenolle (3 out of 6 patents)

Lieven De Jonge (3 out of 5 patents)

Denis Vanderstraeten (2 out of 2 patents)

4. Frank Thys (1 out of 4 patents)

5. Stephen James Crampton (1 out of 4 patents)

6. Peter Champ (1 out of 2 patents)

7. Kris Vallons (1 out of 2 patents)

4 patents: Sort by Forward Citations

1. 8353059 - Optical scanning probe (2013-01-08),

2. 7299145 - Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe (2007-11-20),

3. 7009717 - Optical probe for scanning the features of an object and methods therefor (2006-03-07),

4. 6944564 - Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe (2005-09-13),

Company Overview

Metris N.v. is a leading provider of high-quality optical metrology solutions for advanced manufacturing processes. Their innovative technologies and systems help manufacturers improve accuracy, efficiency, and productivity in a variety of industries such as semiconductor, electronics, and research. With a strong focus on research and development, Metris continues to push the boundaries of metrology to meet the evolving needs of their customers.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#23 in Leuven

#531 in Belgium

Leuven, Belgium

Metris N.v.

Forward Citations = 87

7 inventors:

Bart Van Coppenolle (3 out of 6 patents)

Lieven De Jonge (3 out of 5 patents)

Denis Vanderstraeten (2 out of 2 patents)

4. Frank Thys (1 out of 4 patents)

5. Stephen James Crampton (1 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Metris N.v.. Retrieved from https://idiyas.com/company/metris-n-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]