The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Aug. 13, 2003
Bart Van Coppenolle, Linden, BE;
Lieven DE Jonge, Overijse, BE;
Kris Vallons, Aarschot, BE;
Frank Thys, Willebroek, BE;
Bart Van Coppenolle, Linden, BE;
Lieven De Jonge, Overijse, BE;
Kris Vallons, Aarschot, BE;
Frank Thys, Willebroek, BE;
Metris N.V., Leuven, BE;
Abstract
An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.