Company Filing History:
Years Active: 2006-2008
Title: The Innovative Contributions of Kris Vallons
Introduction
Kris Vallons is a notable inventor based in Aarschot, Belgium. He has made significant contributions to the field of optical technology, particularly through his innovative patents. With a total of two patents to his name, Vallons has demonstrated a commitment to advancing measurement techniques for various objects.
Latest Patents
Kris Vallons' latest patents include an optical probe designed for scanning the features of an object. This optical probe comprises two or more viewing directions and two or more projection directions. The method of measuring features involves configuring the optical probe into multiple optical groups, where each group consists of one or more viewing and projection directions. Notably, at least one viewing direction and one projection direction differ between the optical groups. Data obtained from the viewing directions is generated solely from patterns projected by the projection directions of the same optical group. The method further entails collecting data from each optical group while scanning the object.
Career Highlights
Throughout his career, Vallons has worked with prominent companies such as Metris NV and Metris IPR NV. His experience in these organizations has allowed him to refine his skills and contribute to the development of advanced optical measurement technologies.
Collaborations
Kris Vallons has collaborated with several professionals in his field, including Bart Van Coppenolle and Lieven De Jonge. These collaborations have likely enriched his work and fostered innovation in optical technology.
Conclusion
Kris Vallons stands out as an inventor whose work in optical measurement has the potential to impact various industries. His patents reflect a deep understanding of technology and a drive for innovation.