Company Filing History:
3 out of 4 
2 out of 7 
1 out of 2 Years Active: 2005-2013
Title: Bart Van Coppenolle: Innovator in Dimensional Measurement Technologies
Introduction
Bart Van Coppenolle is a notable inventor based in Linden, Belgium. He has made significant contributions to the field of dimensional measurement technologies, holding a total of six patents. His work focuses on improving the efficiency and accuracy of measuring objects, which is crucial in various industrial applications.
Latest Patents
One of Bart Van Coppenolle's latest patents is a method and computer program for improving the dimensional acquisition of an object. This invention enhances the efficiency of dimensional measurement by directing a measurement device over an object to acquire its dimensions. The process includes steps for indicating the resolution of acquired regions and re-directing the measurement device to ensure sufficient resolution according to predetermined criteria. This method allows for efficient dimensional acquisition at a high level of accuracy.
Another significant patent involves a method, device, and computer program for evaluating an object using a virtual representation. This invention applies commands typically used in measurement equipment to a numerical representation of a physical object. By doing so, it provides a comprehensive evaluation of the physical object through its virtual counterpart.
Career Highlights
Throughout his career, Bart Van Coppenolle has worked with several prominent companies, including Metris N.V. and 3D Scanners Limited. His experience in these organizations has allowed him to develop and refine his innovative ideas in dimensional measurement technologies.
Collaborations
Bart has collaborated with notable professionals in his field, including Lieven De Jonge and Kris Vallons. These partnerships have contributed to the advancement of his inventions and the overall progress in dimensional measurement technologies.
Conclusion
Bart Van Coppenolle is a distinguished inventor whose work in dimensional measurement technologies has led to significant advancements in the field. His innovative patents and collaborations reflect his commitment to improving measurement efficiency and accuracy.