The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
May. 08, 2003
Applicants:
Lieven DE Jonge, Overijse, BE;
Bart Van Coppenolle, Linden, BE;
Denis Vanderstraeten, Louvain-la-Neuve, BE;
Inventors:
Lieven De Jonge, Overijse, BE;
Bart Van Coppenolle, Linden, BE;
Denis Vanderstraeten, Louvain-la-Neuve, BE;
Assignee:
Metris N.V., Leuven, BE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/24 ;
U.S. Cl.
CPC ...
Abstract
The present invention relates to a method for calibrating a non-contact probe on a localizer. The present invention further relates to a method for the simultaneous calibration and qualification of a non-contact probe on a localizer. Both methods do not require user intervention, and use a single artifact.