% Expired Patents = 28.6

CIPO Patents = 1

EPO Patents = 8

Forward Citations = 485

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4 inventors (with patents filed for the assignee):

Stephen James Crampton (4 out of 8 patents)

Bart Van Coppenolle (2 out of 6 patents)

Raffaele Tomelleri (1 out of 2 patents)

4. Lieven De Jonge (1 out of 5 patents)

5. Frank Thys (4 patents)

6. Kris Vallons (2 patents)

7. Denis Vanderstraeten (2 patents)

8. Alex Van Den Bossche (4 patents)

9. Peter Champ (0 patent)

7 patents: Sort by Forward Citations

1. 8520930 - Method and computer program for improving the dimensional acquisition of an object (2013-08-27),

2. RE43895 - Scanning apparatus and method (2012-12-31),

3. 7672810 - Method, device and computer program for evaluating an object using a virtual representation of said object (2010-03-02),

4. 7591078 - CMM arm with exoskeleton (2009-09-22),

5. 7552543 - Probe for gauging machines (2009-06-30),

6. 7395606 - CMM arm with exoskeleton (2008-07-08),

7. 7313264 - Scanning apparatus and method (2007-12-25),

Company Overview

3d Scanners Limited is a leading provider of advanced 3D scanning solutions for a wide range of industries. Our cutting-edge technology allows for highly accurate and detailed scans, helping our clients improve efficiency and quality in their projects. With a team of experienced professionals, we deliver exceptional results and customer satisfaction.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

7 Patents

#435 in London

#2,343 in United Kingdom

London, United Kingdom

3D Scanners Limited

Forward Citations = 485

4 inventors:

Stephen James Crampton (4 out of 8 patents)

Bart Van Coppenolle (2 out of 6 patents)

Raffaele Tomelleri (1 out of 2 patents)

4. Lieven De Jonge (1 out of 5 patents)

5. Frank Thys (4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: 3D Scanners Limited. Retrieved from https://idiyas.com/company/3d-scanners

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

8 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]