Company Filing History:
2 out of 34 
1 out of 2 
1 out of 4 Years Active: 2006-2019
Title: Frank Thys - Innovator in Metrology and Optical Scanning Technologies
Introduction
Frank Thys, a prominent inventor based in Willebroek, Belgium, is recognized for his contributions to the fields of metrology and optical scanning technologies. With a total of four patents to his name, Thys has significantly advanced the way dimensional measurements are conducted through innovative design and engineering.
Latest Patents
Among his latest inventions, the first is a **Measurement Probe Unit for Metrology Applications**. This dimensional measurement probe unit is designed for attachment to a probe head of a localizer. It features a measurement probe for assessing the dimensions of various objects, an integrated revolute joint, and a probe unit interface that allows for a repeated dismountable connection to the probe head.
Another significant invention is the **Optical Scanning Probe**. This device is crafted for the dimensional acquisition of an object by using light. It includes a detection unit equipped with an imaging sensor and sensor lens assembly to detect reflected light. The optical scanning probe incorporates a light projecting unit, which houses a light source for generating and focusing light, along with adjustment mechanisms that enable positioning of the light plane relative to the detection unit. Moreover, it includes a method for the effective assembly of the scanning probe.
Career Highlights
Thys has garnered valuable experience working with leading companies in the industry, including Nikon Metrology and Metris IPR N.V., where he applied his skills in developing advanced measuring technologies.
Collaborations
Throughout his career, Frank Thys has collaborated with notable professionals in his field, such as Bart Van Coppenolle and Lieven De Jonge. These collaborations have greatly influenced his innovations and contributed to the advancement of metrology and scanning technologies.
Conclusion
Frank Thys stands out as a dedicated inventor whose work continues to shape the landscape of measurement technologies. His innovative patents and collaborative efforts reflect his commitment to enhancing the accuracy and efficiency of dimensional measurement processes, thus making a lasting impact on the industry.