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For the Inventor, By the Inventor

Leuven, Belgium

Nikon Metrology Nv


USPTO Granted Patents = 35



Forward Citations = 331

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46 inventors (with patents filed for the assignee):

goldMedal Anthony R Slotwinski (8 out of 13 patents)

silverMedal Roger Hadland (8 out of 8 patents)

bronzeMedal Mina A Rezk (7 out of 8 patents)

4.  Daniel Gene Smith (4 out of 53 patents)

5.  Alexander H Cooper (3 out of 53 patents)

6.  Eric Peter Goodwin (3 out of 48 patents)

7.  Ben Price (3 out of 3 patents)

8.  Michael Beechey (3 out of 3 patents)

9.  James Smith (3 out of 3 patents)

10.  Thomas M Hedges (3 out of 4 patents)

11.  Kurt D Rueb (2 out of 42 patents)

12.  Frank Thys (2 out of 4 patents)

13.  Raf Nysen (2 out of 2 patents)

14.  Jarrad V Morden (2 out of 5 patents)

15.  Stephen James Crampton (2 out of 8 patents)


Core Competencies:
Laser Radar
X-Ray Apparatus
Computed Tomography
Calibration Apparatus
Fiber Interferometer
High Voltage Generator
Measurement Probe
Optical Scanning Probe
Fastener Automation
CMM Arm
Laser Projection Systems

35 patents:

1. 12644988 - Laser radar (2026-06-02),
2. 11877377 - Method of setting a filament demand in an X-ray apparatus, controller, X-ray apparatus, control program and storage medium (2024-01-16),
3. 11680794 - Low drift reference for laser radar (2023-06-20),
4. 10989879 - Thermally compensated fiber interferometer assembly (2021-04-27),
5. 10856398 - High voltage generator (2020-12-01),
6. 10614990 - Target assembly for an x-ray emission apparatus and x-ray emission apparatus (2020-04-07),
7. 10571410 - X-ray apparatus (2020-02-25),
8. 10571409 - X-ray apparatus (2020-02-25),
9. 10478147 - Calibration apparatus and method for computed tomography (2019-11-19),
10. 10463339 - Artefact for evaluating the performance of an X-ray computed tomography system (2019-11-05),
11. 10365233 - X-ray apparatus (2019-07-30),
12. 10283228 - X-ray beam collimator (2019-05-07),
13. 10267629 - Measurement probe unit for metrology applications (2019-04-23),
14. 10180496 - Laser radar with remote local oscillator (2019-01-15),
15. 10166076 - Registration object, correction method and apparatus for computed radiographic tomography (2019-01-01),
Company Overview
Nikon Metrology NV, headquartered in Leuven, Belgium, specializes in advanced metrology solutions that enhance manufacturing processes and quality control. The company develops a range of precision measurement technologies, including optical and laser-based systems, 3D scanning, and inspection software, catering to diverse industries such as aerospace, automotive, and electronics. With a strong focus on innovation, Nikon Metrology aims to provide cutting-edge tools that support the evolving demands of precision engineering and manufacturing excellence.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Nikon Metrology Nv USPTO Patent Assignee Logo
35 Patents

#7 in Leuven

#102 in Belgium

#19,181 in the World

Leuven, BE
Leuven, Belgium

Nikon Metrology Nv

Forward Citations = 331

46 inventors:

goldMedal Anthony R Slotwinski (8 out of 13 patents)

silverMedal Roger Hadland (8 out of 8 patents)

bronzeMedal Mina A Rezk (7 out of 8 patents)

4.  Daniel Gene Smith (4 out of 53 patents)

5.  Alexander H Cooper (3 out of 53 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nikon Metrology Nv. Retrieved from https://idiyas.com/company/nikon-metrology-nv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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