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Leuven, Belgium

Nikon Metrology Nv

USPTO Granted Patents = 34

CIPO Patents = 1

EPO Patents = 29

Forward Citations = 316

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41 inventors (with patents filed for the assignee):

Anthony R Slotwinski (8 out of 13 patents)

Roger Hadland (8 out of 8 patents)

Mina A Rezk (7 out of 8 patents)

4. Alexander H Cooper (3 out of 48 patents)

5. Daniel Gene Smith (3 out of 50 patents)

6. Eric Peter Goodwin (3 out of 46 patents)

7. Ben Price (3 out of 3 patents)

8. Michael Beechey (3 out of 3 patents)

9. James Smith (3 out of 3 patents)

10. Thomas M Hedges (3 out of 4 patents)

11. Kurt D Rueb (2 out of 42 patents)

12. Frank Thys (2 out of 4 patents)

13. Raf Nysen (2 out of 2 patents)

14. Jarrad V Morden (2 out of 5 patents)

15. Stephen James Crampton (2 out of 8 patents)

34 patents: Sort by Forward Citations

1. 11877377 - Method of setting a filament demand in an X-ray apparatus, controller, X-ray apparatus, control program and storage medium (2024-01-16),

2. 11680794 - Low drift reference for laser radar (2023-06-20),

3. 10989879 - Thermally compensated fiber interferometer assembly (2021-04-27),

4. 10856398 - High voltage generator (2020-12-01),

5. 10614990 - Target assembly for an x-ray emission apparatus and x-ray emission apparatus (2020-04-07),

6. 10571410 - X-ray apparatus (2020-02-25),

7. 10571409 - X-ray apparatus (2020-02-25),

8. 10478147 - Calibration apparatus and method for computed tomography (2019-11-19),

9. 10463339 - Artefact for evaluating the performance of an X-ray computed tomography system (2019-11-05),

10. 10365233 - X-ray apparatus (2019-07-30),

11. 10283228 - X-ray beam collimator (2019-05-07),

12. 10267629 - Measurement probe unit for metrology applications (2019-04-23),

13. 10180496 - Laser radar with remote local oscillator (2019-01-15),

14. 10166076 - Registration object, correction method and apparatus for computed radiographic tomography (2019-01-01),

15. 10119816 - Low drift reference for laser radar (2018-11-06),

Nikon Metrology NV is a global provider of metrology solutions, offering a wide range of precision measurement instruments and systems. With a focus on industrial metrology and inspection, Nikon Metrology supports various industries including automotive, aerospace, medical, and more. Their advanced measurement technologies enable customers to improve productivity, quality, and efficiency in their manufacturing processes. Visit their website for more information about their products and services.

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USPTO Data Jan 1 1976 - Dec 30 2025

34 Patents

#10 in Leuven

#106 in Belgium

#19,059 in the World

Leuven, Belgium

Nikon Metrology Nv

Forward Citations = 316

41 inventors:

Anthony R Slotwinski (8 out of 13 patents)

Roger Hadland (8 out of 8 patents)

Mina A Rezk (7 out of 8 patents)

4. Alexander H Cooper (3 out of 48 patents)

5. Daniel Gene Smith (3 out of 50 patents)

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