The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Apr. 08, 2015
Applicant:
Nikon Metrology NV, Leuven, BE;
Inventors:
Frank Thys, Willebroek, BE;
Hans Thielemans, Rotselaar, BE;
Raf Nysen, Veltem-Beisem, BE;
Laurens Van Horenbeek, Haacht, BE;
Assignee:
NIKON METROLOGY NV, Leuven, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01); G01B 21/04 (2006.01); G01B 7/012 (2006.01); G01B 11/00 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01B 21/047 (2013.01); G01B 5/012 (2013.01); G01B 7/012 (2013.01); G01B 11/007 (2013.01); G01R 1/067 (2013.01);
Abstract
The present invention provides a dimensional measurement probe unit () for attachment to a probe head () of a localizer (), comprising: a measurement probe () for dimensional measurement of an object (); a revolute joint () integrated into the measurement probe (); and a probe unit interface () for repeated dismountable connection to a probe head () wherein the probe unit interface () is revolutely connected to the measurement probe () by the revolute joint ().