Nikon Metrology Nv

Metris N.v.

Metris Ipr N.v.

3d Scanners Limited

Frank Thys

Bart Van Coppenolle

Lieven De Jonge

Kris Vallons

Raf Nysen

Patrick Blanckaert

Geert Vandenhoudt

Hans Thielemans

Laurens Van Horenbeek

The present invention provides a dimensional measurement probe unit () for attachment to a probe head () of a localizer (), comprising: a measurement probe () for dimensional measurement of an object (); a revolute joint () integrated into the measurement probe (); and a probe unit interface () for repeated dismountable connection to a probe head () wherein the probe unit interface () is revolutely connected to the measurement probe () by the revolute joint ().

Measurement probe unit for metrology applications

The present invention relates to a scanning probe () for the dimensional acquisition of an object () by irradiating the object () with light and detecting reflected light comprising: a detection unit () comprising an imaging sensor () and a sensor lens assembly () for detecting the reflected light, a light projecting unit () comprising a light source () for generating light, and source optics () for focusing the light, and light plane generating optics () for generating a light plane () for irradiating the object, and an adjustment mechanism () comprised in the light projecting unit (), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe ().

Optical scanning probe

An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an optical group comprises one or more viewing directions and one or more projection directions, wherein at least one viewing direction and at least one projection direction is different between the optical groups, and wherein data obtained by the viewing directions is generated only from patterns projected by the projection directions of the same optical group. The method further comprises collecting data from each optical group while scanning the object.

Optical probe for scanning the features of an object and methods thereof

Optical probe for scanning the features of an object and methods therefor

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Willebroek, Belgium

Frank Thys