The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Jul. 14, 2006
Applicants:
Lieven DE Jonge, Overijse, BE;
Bart Van Coppenolle, Linden, BE;
Denis Vanderstraeten, Louvain-la-Neuve, BE;
Inventors:
Lieven De Jonge, Overijse, BE;
Bart Van Coppenolle, Linden, BE;
Denis Vanderstraeten, Louvain-la-Neuve, BE;
Assignee:
Metris N.V., Leuven, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to an improved method for the simultaneous calibration and qualification of a non-contact probe on a localizer using a single artifact, in which non-contact probe readings and localizer readings are synchronised using parameters determined simultaneously with calibration and qualification. The invention also relates to a non-contact probe and other devices, and a computer program for performing the invention.