For the Inventor, By the Inventor

Enter assignee name

Berlin, Germany

Jpk Instruments Ag

USPTO Granted Patents = 18

% Expired Patents = 33.3

EPO Patents = 3

Trademarks = 2

Forward Citations = 181

Loading Chart...

Loading Chart...

20 inventors (with patents filed for the assignee):

Detlef Knebel (10 out of 12 patents)

Torsten Jähnke (9 out of 10 patents)

Olaf Sünwoldt (4 out of 4 patents)

4. Matthias W Amrein (3 out of 5 patents)

5. Torsten Müller (3 out of 21 patents)

6. Kathryn Anne Poole (3 out of 3 patents)

7. Jörn Kamps (2 out of 2 patents)

8. Tilo Jankowski (1 out of 3 patents)

9. Michael Richard Haggerty (1 out of 4 patents)

10. Gerd Behme (1 out of 1 patent)

11. Gunnar Sommer (1 out of 1 patent)

12. Yan Shi (1 out of 1 patent)

13. Sven-Peter Heyn (1 out of 1 patent)

14. Jacob Kerssemakers (1 out of 1 patent)

15. Helge Eggert (1 out of 1 patent)

18 patents: Sort by Forward Citations

1. 9080937 - Apparatus and a method for investigating a sample by means of several investigation methods (2015-07-14),

2. 9063335 - Apparatus and method for examining a specimen by means of probe microscopy (2015-06-23),

3. 9018018 - Method and apparatus for determining the cell activation of a target cell by an activator (2015-04-28),

4. 8898809 - Method and apparatus for the combined analysis of a sample with objects to be analyzed (2014-11-25),

5. 8769711 - Method for examining a measurement object, and apparatus (2014-07-01),

6. 8506909 - Device for receiving a test sample (2013-08-13),

7. 8505109 - Measuring probe device for a probe microscope, measuring cell and scanning probe microscope (2013-08-06),

8. 8415613 - Method and apparatus for characterizing a sample with two or more optical traps (2013-04-09),

9. 8381311 - Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system (2013-02-19),

10. 8368017 - Method for the operation of a measurement system with a scanning probe microscope and a measurement system (2013-02-05),

11. 7971266 - Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope (2011-06-28),

12. 7934323 - Method and a device for the positioning of a displaceable component in an examining system (2011-05-03),

13. 7473894 - Apparatus and method for a scanning probe microscope (2009-01-06),

14. 7442922 - Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology (2008-10-28),

15. 7155962 - Method and apparatus to study a surfactant (2007-01-02),

JPK Instruments AG, based in Berlin, specializes in advanced microscopy and nanotechnology solutions. The company focuses on developing high-performance instruments for applications in life sciences, materials science, and nanotechnology research. JPK's innovative products enable researchers to explore and manipulate materials at the nanoscale, facilitating breakthroughs in various scientific fields. With a commitment to precision and quality, JPK Instruments plays a vital role in enhancing the capabilities of laboratories and research institutions globally.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

18 Patents

#56 in

#2,390 in Germany

#34,146 in the World

Berlin, Germany

Jpk Instruments Ag

Forward Citations = 181

20 inventors:

Detlef Knebel (10 out of 12 patents)

Torsten Jähnke (9 out of 10 patents)

Olaf Sünwoldt (4 out of 4 patents)

4. Matthias W Amrein (3 out of 5 patents)

5. Torsten Müller (3 out of 21 patents)

Please report any incorrect information to [email protected]

Loading…